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氢退火注碳外延硅发光特性研究
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TN304.13

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Photoluminescence Properties of C~+ Implanted Epitaxial Si Annealed in Hydrogen Ambience
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    摘要:

    外延硅经过碳注入、氢气氛下高温退火和电化学腐蚀相继处理之后,发出位于431nm左右的蓝色荧光峰。随电化学腐蚀条件的增强,蓝色荧光峰先变强后消失,并出现位于716nm处的红光峰。样品中随碳注入而注入的杂质C=O复合体镶嵌在退火过程所形成的纳米硅颗粒的表面,形成典型的纳米硅镶嵌结构。正是这种结构导致了蓝光发射。

    Abstract:

    Blue luminescence at about 431nm is obtained from epitaxial silicon after sequential processing of C+ implantation, annealing in hydrogen ambience and chemical etching. With the increase of chemical etching, the blue peak was enhanced at first, decreased then and substituted by a red peak at last. C=O compounds induced during C+ implantation are embedded in the surface of nanometer Si formed during annealing, and nanometer silicon with embedded structure is formed at last, which contributes to the blue emission.

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王强 李玉国 石礼伟 薛成山.氢退火注碳外延硅发光特性研究[J].稀有金属材料与工程,2005,34(2):256~258.[Wang Qiang, Li Yuguo, Shi Liwei, Xue Chengshan. Photoluminescence Properties of C~+ Implanted Epitaxial Si Annealed in Hydrogen Ambience[J]. Rare Metal Materials and Engineering,2005,34(2):256~258.]
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  • 最后修改日期:2003-06-13
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