TG111.6 TG146.1
国家自然科学基金重点项目(59931010)
白宣羽 汪渊 徐可为. Cu-Zr／ZrN薄膜体系的电阻率和纳米压入研究[J].稀有金属材料与工程,2005,34(2):259~262.[Bai Xuanyu, Wang Yuan, Xu Kewei. Characterization of the Resistivity and Nanoindentation Hardness of Cu-Zr/ZrN Films[J]. Rare Metal Materials and Engineering,2005,34(2):259~262.]
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