Formation of Stress-Induced Nano Defects in Shear Bands of Metallic Glasses

Home > Archive>Volume 39, Issue 6, 2010 >941-944

Formation of Stress-Induced Nano Defects in Shear Bands of Metallic Glasses
DOI:
                        
                    
Author:
                        Gu XiaofengGu Xiaofeng
Jiangnan University, Wuxi 214122, China
Find this author on All Journals
Find this author on BaiDu
Search for this author on this site
Wang JunWang Jun
State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China
Find this author on All Journals
Find this author on BaiDu
Search for this author on this site
Qin WeidongQin Weidong
State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China
Find this author on All Journals
Find this author on BaiDu
Search for this author on this site
Qin WeidongQin Weidong
State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China
Find this author on All Journals
Find this author on BaiDu
Search for this author on this site
Li JinshanLi Jinshan
State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China
Find this author on All Journals
Find this author on BaiDu
Search for this author on this site
Zhou LianZhou Lian
State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi’an 710072, China
Find this author on All Journals
Find this author on BaiDu
Search for this author on this site

                    
Affiliation:
Clc Number:
Fund Project:National Natural Science Foundation of China (50601011); National Basic Research Program of China (2007CB607603); Program for NCETs in University (NCET-06-0484); NSF of Jiangsu Province (BK2006533); Fundamental Research Funds for the Central Universities (JUSRP20914)

Article

Figures

Metrics

Reference

Cited by

Materials

Comments

Abstract:

Transmission electron microscopy (TEM) specimens of Zr-based metallic glasses were prepared from amorphous ribbons. Shear bands produced by bending these specimens were located by TEM. High resolution transmission electron microscopy analysis indicates the existence of nanoscale void-like defects and high-density areas in shear bands. The formation of these defects is believed resulting from the evolution of stress-activated free volumes during the mechanical loading and the removal of external stress, which can be understood by comparing the stress-induced processes in shear bands in analogy with the thermal annealing effects on similar metallic glasses

Key words:metallic glass; transmission electron microscopy; shear band; annealing

Get Citation

[Gu Xiaofeng, Wang Jun, Qin Weidong, Qin Weidong, Li Jinshan, Zhou Lian. Formation of Stress-Induced Nano Defects in Shear Bands of Metallic Glasses[J]. Rare Metal Materials and Engineering,2010,39(6):941~944.]
DOI：[doi]

Copy

Article Metrics

Abstract:
PDF:
HTML:
Cited by:

History

Received:June 14,2009
Revised:
Adopted:
Online:
Published:

Home

Introduction

Editorial Board

Submission Guideline

Contact Us

中文

Get Citation

Article Metrics

History